• DocumentCode
    1023749
  • Title

    Nonlinear coupling with silicon tunnel junctions in integrated logic

  • Author

    Josephs, H.C. ; Maupin, J.T. ; Zook, J.D.

  • Author_Institution
    Honeywell Research Center, Hopkins, Minn.
  • Volume
    12
  • Issue
    5
  • fYear
    1965
  • fDate
    5/1/1965 12:00:00 AM
  • Firstpage
    237
  • Lastpage
    241
  • Abstract
    Most of the logic schemes that are amenable to integrated semiconductor construction utilize resistances to couple transistor stages to a power supply and to other stages. It is shown that the coupling functions ideally require nonlinear rather than linear current-voltage characteristics. Tunnel junctions can provide very attractive nonlinear characteristics for coupling purposes, and this is the main theme of the present paper. Performance advantages are investigated, particularly the improvement in delay-power product, or energy required to process a binary digit. Techniques for fabricating low-capacitance tunnel junctions in integrated fashion with silicon bipolar transistor regions are discussed.
  • Keywords
    Contact resistance; Coupling circuits; Joining processes; Logic; Piecewise linear techniques; Power supplies; Resistors; Semiconductor diodes; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1965.15486
  • Filename
    1473950