DocumentCode :
1023955
Title :
IEEE standard on definitions, symbols, and methods of test for semiconductor tunnel (Esaki) diodes and backward diodes
Volume :
12
Issue :
6
fYear :
1965
fDate :
6/1/1965 12:00:00 AM
Firstpage :
373
Lastpage :
386
Keywords :
IEEE standards;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1965.15508
Filename :
1473972
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1023955
