DocumentCode
1024020
Title
SpectreHDL as tool for noise analysis of poly-Si TFT circuits
Author
Rankov, A. ; Rodriguez-Villegas, E. ; Lee, M.J.
Author_Institution
Dept. of Electr. & Electron. Eng., Imperial Coll., London, UK
Volume
40
Issue
13
fYear
2004
fDate
6/24/2004 12:00:00 AM
Firstpage
837
Lastpage
839
Abstract
Because of no general noise model in poly-Si TFT technologies, a noise analysis of poly-Si TFT circuits is currently unavailable in any circuit simulator. Therefore it is shown how to make use of the SpectreHDL language for this purpose once the device noise model is extracted from measurement results.
Keywords
circuit noise; circuit simulation; current density; elemental semiconductors; flicker noise; hardware description languages; silicon; thermal noise; transistor circuits; Si; Spectre high-level description language; SpectreHDL; drain current spectral density; noise analysis; poly-Si thin film transistors circuits;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20040504
Filename
1309752
Link To Document