• DocumentCode
    1024138
  • Title

    Application of strong fluctuation random medium theory to scattering of electromagnetic waves from a half-space of dielectric mixture

  • Author

    Tsang, Leung ; Kong, Jin A. ; Newton, Richard W.

  • Author_Institution
    Texas A&M Univ., College Station, TX, USA
  • Volume
    30
  • Issue
    2
  • fYear
    1982
  • fDate
    3/1/1982 12:00:00 AM
  • Firstpage
    292
  • Lastpage
    302
  • Abstract
    The strong fluctuation random medium theory is applied to calculate scattering from a half-space of dielectric mixture. The first and second moments of the fields are calculated, respectively, by using the bilocal and the distorted Born approximations, and the low frequency limit is taken. The singularity of the dyadic Green´s function is taken into account. Expressions for the effective permittivity for the full space case are derived. It is shown that the derived result of the effect permittivity is identical to that of the Polder and van Santern mixing formula. The correlation function of the random medium is obtained by using simple physical arguments and is expressed in terms of the fractional volumes and particle sizes of the constituents of the mixture. Backscattering coefficients of a half-space dielectric mixture are also calculated. Numerical results of the effective permittivity and backscattering coefficients are illustrated using typical parameters encountered in microwave remote sensing of dry and wet snow. It is also shown that experimental data can be matched with the theory by using physical parameters of the medium as obtained from ground truth measurements.
  • Keywords
    Electromagnetic scattering by random media; Meteorology; Radar imaging/mapping; Terrain mapping; Approximation methods; Backscatter; Dielectrics; Electromagnetic scattering; Fluctuations; Frequency; Green´s function methods; Particle scattering; Permittivity; Remote sensing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.1982.1142774
  • Filename
    1142774