DocumentCode
1024211
Title
A decomposition scheme for the analysis of fault trees and other combinatorial circuits
Author
Helman, Paul ; Rosenthal, Arnon
Author_Institution
New Mexico Univ., Albuquerque, NM, USA
Volume
38
Issue
3
fYear
1989
fDate
8/1/1989 12:00:00 AM
Firstpage
312
Abstract
A new decomposition scheme for the analysis of fault trees and other more general combinatorial circuits is presented. The scheme is based on a tabular representation for the necessary information about a subsystem and generalizes the concept of modular decomposition. The basic algorithm is extended to obtain a very fast method for finding the sensitivity of the results to a large class of perturbations of the data. The scheme can be used to compute and analyze the sensitivity of many different types of measures on a circuit. The authors give a pair of axioms that capture sufficient conditions for the scheme to apply to computing a given measure and explicitly consider three different computational problems. A single algorithm is tailored to solve a new problem simply by supplying it with the necessary problem-specific subroutines. The efficiency of the algorithm depends on the choice of decomposition tree; the authors propose two simple heuristics for constructing a good decomposition tree. A theorem is obtained implying that if an efficient decomposition tree is found for the basic algorithm, the extended algorithm will also be efficient
Keywords
circuit reliability; combinatorial circuits; failure analysis; reliability theory; sensitivity analysis; trees (mathematics); algorithm; combinatorial circuits; decomposition scheme; decomposition tree; fault tree analysis; heuristics; modular decomposition; problem-specific subroutines; reliability; sensitivity; sufficient conditions; tabular representation; Algorithm design and analysis; Circuit analysis computing; Combinational circuits; Computational complexity; Costs; Distributed computing; Fault trees; Information analysis; Probability distribution; Sensitivity analysis;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.44173
Filename
44173
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