• DocumentCode
    1024211
  • Title

    A decomposition scheme for the analysis of fault trees and other combinatorial circuits

  • Author

    Helman, Paul ; Rosenthal, Arnon

  • Author_Institution
    New Mexico Univ., Albuquerque, NM, USA
  • Volume
    38
  • Issue
    3
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    312
  • Abstract
    A new decomposition scheme for the analysis of fault trees and other more general combinatorial circuits is presented. The scheme is based on a tabular representation for the necessary information about a subsystem and generalizes the concept of modular decomposition. The basic algorithm is extended to obtain a very fast method for finding the sensitivity of the results to a large class of perturbations of the data. The scheme can be used to compute and analyze the sensitivity of many different types of measures on a circuit. The authors give a pair of axioms that capture sufficient conditions for the scheme to apply to computing a given measure and explicitly consider three different computational problems. A single algorithm is tailored to solve a new problem simply by supplying it with the necessary problem-specific subroutines. The efficiency of the algorithm depends on the choice of decomposition tree; the authors propose two simple heuristics for constructing a good decomposition tree. A theorem is obtained implying that if an efficient decomposition tree is found for the basic algorithm, the extended algorithm will also be efficient
  • Keywords
    circuit reliability; combinatorial circuits; failure analysis; reliability theory; sensitivity analysis; trees (mathematics); algorithm; combinatorial circuits; decomposition scheme; decomposition tree; fault tree analysis; heuristics; modular decomposition; problem-specific subroutines; reliability; sensitivity; sufficient conditions; tabular representation; Algorithm design and analysis; Circuit analysis computing; Combinational circuits; Computational complexity; Costs; Distributed computing; Fault trees; Information analysis; Probability distribution; Sensitivity analysis;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.44173
  • Filename
    44173