DocumentCode
1024218
Title
Special Issue on 3D IC Design and Test
Author
Kung, David ; Xie, Yuan
Author_Institution
(IBM Research)
Volume
25
Issue
6
fYear
2008
Firstpage
505
Lastpage
505
Abstract
Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.168
Filename
4702871
Link To Document