DocumentCode :
1024435
Title :
Low-loss slow-wave propagation along a microstructure transmission line on a silicon surface
Author :
Hietala, V.M. ; Kwon, Y.R. ; Champlin, K.S.
Author_Institution :
University of Minnesota, Department of Electrical Engineering, Minneapolis, USA
Volume :
22
Issue :
14
fYear :
1986
Firstpage :
755
Lastpage :
756
Abstract :
We report observations of relatively low-loss propagation in the frequency range of 1.0 to 12.4 GHz using a micrometer-size coplanar MIS transmission line fabricated on a heavily doped N + silicon surface. This low-loss mode of propagation is found to be accompanied by significant wavelength reduction which suggests that such lines may be useful as transmission media for distributed components in silicon monolithic microwave integrated circuits (MMICs).
Keywords :
guided electromagnetic wave propagation; metal-insulator-semiconductor devices; microwave integrated circuits; waveguides; 1.0 GHz to 12.4 GHz; Si surface; coplanar MIS transmission line; low-loss propagation; microstructure transmission; monolithic microwave integrated circuits; wavelength reduction;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19860519
Filename :
4256722
Link To Document :
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