DocumentCode :
1024823
Title :
Effect of diffusion current on the device characteristics of insulated-gate field-effect transistors
Author :
Sah, C.T.
Volume :
12
Issue :
9
fYear :
1965
fDate :
9/1/1965 12:00:00 AM
Firstpage :
509
Lastpage :
509
Keywords :
FETs; Gallium arsenide; Gold; Heterojunctions; Insulation; Laboratories; Lighting; Semiconductor diodes; Semiconductor films; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1965.15593
Filename :
1474057
Link To Document :
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