Title :
Effect of the bulk charge on the thermal noise in metal-oxide-silicon field-effect transistors
Author :
Sah, C.T. ; Hielscher, F.H. ; Wu, S.Y.
fDate :
9/1/1965 12:00:00 AM
Keywords :
Conductivity; FETs; Gallium arsenide; Gold; Heterojunctions; Laboratories; Lighting; Semiconductor diodes; Semiconductor films; Silicon;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1965.15594
