• DocumentCode
    1024947
  • Title

    Simulating the dynamic electrothermal behavior of power electronic circuits and systems

  • Author

    Hefner, Allen R. ; Blackburn, David L.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    8
  • Issue
    4
  • fYear
    1993
  • fDate
    10/1/1993 12:00:00 AM
  • Firstpage
    376
  • Lastpage
    385
  • Abstract
    The simulator solves for the temperature distribution within the semiconductor devices, packages, and heat sinks (thermal network) as well as the currents and voltages within the electrical network. The thermal network is coupled to the electrical network through the electrothermal models for the semiconductor devices. The electrothermal semiconductor device models calculate the electrical characteristics based on the instantaneous value of the device silicon chip surface temperature and calculate the instantaneous power dissipated as heat within the device. The thermal network describes the flow of heat from the chip surface through the package and heat sink and thus determines the evolution of the chip surface temperature used by the semiconductor device models. The thermal component models for the device silicon chip, packages, and heat sinks are developed by discretizing the nonlinear heat diffusion equation and are represented in component form so that the thermal component models for various packages and heat sinks can be readily connected to one another to form the thermal network
  • Keywords
    heat sinks; packaging; power electronics; semiconductor device models; temperature distribution; thermal analysis; dynamic electrothermal behavior simulation; electrical characteristics; electrical network; heat sinks; instantaneous power dissipation; nonlinear heat diffusion equation; packages; power electronic circuits; power electronic systems; semiconductor devices; silicon chip surface temperature; temperature distribution; thermal component models; thermal network; Electronic packaging thermal management; Electrothermal effects; Heat sinks; Power electronics; Resistance heating; Semiconductor device modeling; Semiconductor device packaging; Semiconductor devices; Silicon; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/63.261007
  • Filename
    261007