DocumentCode
1024947
Title
Simulating the dynamic electrothermal behavior of power electronic circuits and systems
Author
Hefner, Allen R. ; Blackburn, David L.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume
8
Issue
4
fYear
1993
fDate
10/1/1993 12:00:00 AM
Firstpage
376
Lastpage
385
Abstract
The simulator solves for the temperature distribution within the semiconductor devices, packages, and heat sinks (thermal network) as well as the currents and voltages within the electrical network. The thermal network is coupled to the electrical network through the electrothermal models for the semiconductor devices. The electrothermal semiconductor device models calculate the electrical characteristics based on the instantaneous value of the device silicon chip surface temperature and calculate the instantaneous power dissipated as heat within the device. The thermal network describes the flow of heat from the chip surface through the package and heat sink and thus determines the evolution of the chip surface temperature used by the semiconductor device models. The thermal component models for the device silicon chip, packages, and heat sinks are developed by discretizing the nonlinear heat diffusion equation and are represented in component form so that the thermal component models for various packages and heat sinks can be readily connected to one another to form the thermal network
Keywords
heat sinks; packaging; power electronics; semiconductor device models; temperature distribution; thermal analysis; dynamic electrothermal behavior simulation; electrical characteristics; electrical network; heat sinks; instantaneous power dissipation; nonlinear heat diffusion equation; packages; power electronic circuits; power electronic systems; semiconductor devices; silicon chip surface temperature; temperature distribution; thermal component models; thermal network; Electronic packaging thermal management; Electrothermal effects; Heat sinks; Power electronics; Resistance heating; Semiconductor device modeling; Semiconductor device packaging; Semiconductor devices; Silicon; Temperature distribution;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/63.261007
Filename
261007
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