Correction [to "IEEE standard test procedure for semiconductor diodes"]

Summary form only given, as follows. Attention has been called to the incorrect Committee listing in the "IEEE Standard Test Procedure for Semiconductor Diodes," which appeared on pages 398-402 of the August, 1964, issue of these Transactions. The second paragraph of the \´ACKNOWLEDGMENT\´ should read as follows. "This publication was prepared by the IEEE Task Group 28.4.10 composed of: B. Jacobs, Chairman; A. Bakanowski; J. Gillette; D.R. Fewer; E.F. Platz; and the jointly functioning ...."