DocumentCode :
1025016
Title :
A metal-insulator-piezoelectric semiconductor electromechanical transducer
Author :
Muller, R.S. ; Conragan, J.
Author_Institution :
University of California, Berkeley, Calif.
Volume :
12
Issue :
11
fYear :
1965
fDate :
11/1/1965 12:00:00 AM
Firstpage :
590
Lastpage :
595
Abstract :
A deposited metal-insulator-piezoelectric-semiconductor (MIPS) transistor can be used as an electromechanical transducer, because of the sensitivity of the power-gain mechanism in a surface field-effect device to fixed charge in the channel. Close correspondence has been obtained between the theory of this effect and experimental observations on deposited CdS MIPS devices. The transducer action described in this paper is quite different from that employed in other piezoelectric pressure transducers, and has beneficial characteristics such as high sensitivity and flat gain to high frequencies. Comparisons with conventional transducers are made, and design considerations of the MIPS transducer are discussed.
Keywords :
Dielectric materials; FETs; Insulation; MOS devices; Metal-insulator structures; Piezoelectric materials; Piezoelectric polarization; Piezoelectric transducers; Stress; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1965.15614
Filename :
1474078
Link To Document :
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