• DocumentCode
    1025200
  • Title

    Temperature Dependence of Radiative and Auger Losses in Quantum Wells

  • Author

    Hader, Jörg ; Moloney, Jerome V. ; Koch, Stephan W.

  • Author_Institution
    Nonlinear Control Strategies, Inc., Tucson
  • Volume
    44
  • Issue
    2
  • fYear
    2008
  • Firstpage
    185
  • Lastpage
    191
  • Abstract
    Fully microscopic models are used to study the temperature dependence of carrier losses due to radiative and Auger recombination processes in semiconductor quantum wells. The temperature (T) dependence of these loss processes is shown to depend on the carrier density, on details of the bandstructure, and on the Coulomb effects. While classical estimates based on simplified models predict a density independent 1/T-variation of the radiative losses, we find for the example of typical 1.3 mum InGaAsP structures a dependence closer to 1/T3 at low densities. At high densities the temperature dependence is much weaker and can no longer be described by a simple power law. For a given density the Auger losses can be described by an exponential temperature dependence for limited temperature ranges if one uses a density dependent activation energy that can take positive or negative values.
  • Keywords
    Auger effect; III-V semiconductors; band structure; carrier density; electron-hole recombination; gallium arsenide; gallium compounds; indium compounds; quantum well lasers; semiconductor quantum wells; Auger recombination process; Coulomb effects; InGaAsP; activation energy; band structure; carrier density; carrier losses; radiative recombination process; semiconductor quantum wells; threshold current; Charge carrier density; Laser modes; Laser theory; Microscopy; Physics; Predictive models; Radiative recombination; Spontaneous emission; Temperature dependence; Temperature distribution; Auger recombination; InGaAsP; gain; modeling; quantum-well lasers; spontaneous emission; threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2007.910938
  • Filename
    4418448