DocumentCode

1025342

Title

Judging Mica Quality Electrically

Author

Coutlee, K.G.

Author_Institution

Bell Telephone Laboratories, Inc., New York, N. Y.

Volume

64

Issue

11

fYear

1945

Firstpage

735

Lastpage

741

Keywords

Capacitors; Dielectric breakdown; Dielectric losses; High-K gate dielectrics; Laboratories; Production; Pulp manufacturing; Telephony; Testing; Visual system;

fLanguage

English

Journal_Title

American Institute of Electrical Engineers, Transactions of the

Publisher

ieee

ISSN

0096-3860

Type

jour

DOI

10.1109/T-AIEE.1945.5059032

Filename

5059032