Title :
Judging Mica Quality Electrically
Author_Institution :
Bell Telephone Laboratories, Inc., New York, N. Y.
Keywords :
Capacitors; Dielectric breakdown; Dielectric losses; High-K gate dielectrics; Laboratories; Production; Pulp manufacturing; Telephony; Testing; Visual system;
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
DOI :
10.1109/T-AIEE.1945.5059032
