Title :
Synchronized world embedding in virtual environments
Author :
de Oliveira, Jauvane C. ; Yu, Seok Jong ; Georganas, Nicolas D.
Author_Institution :
Dept. of Comput. Sci., Nat. Lab. for Sci. Comput., Petropolis, Brazil
Abstract :
We introduce a novel distributed approach that lets users copy a given CVE section and keep it consistent with all its other copies and its original CVE area. Although 3D world modeling tools such as Alias´ Maya and Discreet´s 3DS Max already use object embedding, our method is the first to introduce it in a functioning CVE system. We also expand the traditional object-embedding concept by introducing a mutual synchronization function between the source and destination worlds. The mutual synchronization scheme propagates events $such as changes in an object´s color, shape, or position - to other copies of a world. This synchronized world embedding thus offers a new way to expand worlds. Our method is built on existing CVE functionality, which lets us deploy it without significantly interfering with existing CVE designs. We´ve also altered the method so that it´s usable when consistency needs are more relaxed.
Keywords :
hypermedia; portals; solid modelling; synchronisation; tree data structures; user interfaces; virtual reality; 3D world modeling tools; functioning CVE system; hyperlinks; mutual synchronization function; object embedding; synchronized world embedding; virtual environment portals; Aerospace electronics; Collaboration; Computational modeling; HTML; Large-scale systems; Military computing; Space technology; Virtual environment; Virtual reality; World Wide Web; CVE; LSVE; VELVET; collaborative virtual environments; consistency control; embedded worlds; large-scale virtual environments; ownership management; virtual reality; Algorithms; Computer Communication Networks; Computer Graphics; Computer Simulation; Environment; Information Storage and Retrieval; Internet; Online Systems; Time Factors; User-Computer Interface;
Journal_Title :
Computer Graphics and Applications, IEEE
DOI :
10.1109/MCG.2004.18