Self-calibration techniques for a second-order multibit sigma-delta modulator

Author

Fattaruso, John W. ; Kiriaki, Sami ; De Wit, Michiel ; Warwar, Greg

Author_Institution

Integrated Syst. Lab., Texas Instrum. Inc., Dallas, TX, USA

Volume

28

Issue

12

fYear

1993

fDate

12/1/1993 12:00:00 AM

Firstpage

1216

Lastpage

1223

Abstract

Design techniques for self-calibration of the digital-to-analog converter DAC in a multibit sigma-delta modulator are described. When used in conjunction with dynamic element matching, self-calibration provides linearity performance suitable for digital audio applications. The dynamic element matching circuitry provides the mechanism of determining device mismatch for self-calibration. Practical circuit details and an effective calibration method are discussed. Test results from a l-μm CMOS test chip are presented. In this test system, a second-order loop with a 3-b quantizer achieves an 89-dB dynamic range and -91-dB harmonic distortion after calibration. In addition, a new method of detecting the presence of tones is described, using the entropy of the spectrum of the decimation filter output

Keywords

CMOS integrated circuits; calibration; delta modulation; digital-analogue conversion; modulators; 1 mum; 100 mW; 3-b quantizer; 5 V; CMOS test chip; DAC; decimation filter output spectrum entropy; device mismatch; digital audio applications; digital-to-analog converter; dynamic element matching; dynamic range; harmonic distortion; linearity performance; multibit sigma-delta modulator; power dissipation; second-order loop; self-calibration; tone detection; Calibration; Circuit testing; Delta-sigma modulation; Digital modulation; Digital-analog conversion; Dynamic range; Entropy; Harmonic distortion; Linearity; System testing;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.261995

Filename

261995