Title :
Precise delay generation using coupled oscillators
Author :
Maneatis, John G. ; Horowitz, Mark A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
12/1/1993 12:00:00 AM
Abstract :
A new delay generator based on a series of coupled ring oscillators has been developed; it produces precise delays with subgate delay resolution for chip testing applications. It achieves a delay resolution equal to a buffer delay divided by the number of rings. The coupling employed forces the outputs of a linear array of ring oscillators oscillating at the same frequency to be uniformly offset in phase by a precise fraction of a buffer delay. The buffer stage used in the ring oscillators is based on a source-coupled pair and achieves high supply noise rejection while operating at low supply voltages. Experimental results from a 2-μm N-well CMOS implementation of the delay generator demonstrate that it can achieve an output delay resolution of 101 ps while operating at 141 MHz with a peak error of 58 ps
Keywords :
CMOS integrated circuits; buffer circuits; delay circuits; integrated circuit testing; oscillators; test equipment; 101 ps; 141 MHz; 2 micron; N-well CMOS implementation; buffer stage; chip testing applications; coupled oscillators; delay generator; precise delay generation; ring oscillators; source-coupled pair; subgate delay resolution; Circuit testing; Clocks; Delay; Frequency; Integrated circuit technology; Integrated circuit testing; Low voltage; Phased arrays; Ring oscillators; Voltage-controlled oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of