DocumentCode :
1025604
Title :
Electrothermal simulation of integrated circuits
Author :
Lee, Sang-Soo ; Allstot, David J.
Author_Institution :
Micro Linear Corp., San Jose, CA, USA
Volume :
28
Issue :
12
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
1283
Lastpage :
1293
Abstract :
This paper describes new techniques for simulating the DC and steady-state thermal characteristics of integrated circuits using the incomplete Choleski conjugate gradient (ICCG) method, and transient electrothermal performance using an efficient macromodeling method based on asymptotic waveform evaluation (AWE). Results on several benchmark circuits show orders of magnitude reductions in CPU time and memory with accuracy comparable to that of the traditional techniques
Keywords :
circuit analysis computing; conjugate gradient methods; digital simulation; equivalent circuits; integrated circuit technology; monolithic integrated circuits; thermal analysis; transient response; DC characteristics; asymptotic waveform evaluation; electrothermal simulation; incomplete Choleski conjugate gradient method; integrated circuits; macromodeling method; steady-state thermal characteristics; transient electrothermal performance; Circuit simulation; Computational modeling; Electrothermal effects; Integrated circuit modeling; Packaging; Power dissipation; Steady-state; Temperature; Very large scale integration; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.262001
Filename :
262001
Link To Document :
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