A 12.5 Gb/s Si bipolar IC for PRBS generation and bit error detection up to 25 Gb/s

Author

Bussmann, Matthias ; Langmann, Ulrich ; Hillery, William J. ; Brown, William W.

Author_Institution

Ruhr-Univ., Bochum, Germany

Volume

28

Issue

12

fYear

1993

fDate

12/1/1993 12:00:00 AM

Firstpage

1303

Lastpage

1309

Abstract

This paper describes a Si bipolar IC which features PRBS generation, bit error detection, (de-) scrambling, and trigger derivation up to 12.5 Gb/s. The sequence length is switchable between 2 ¹¹-1 and 2¹⁵-1 b. Two input/output channels are provided which allow PRBS testing up to 25 Gb/s with one external MUX/DMUX. The 3×4 mm², 1377 transistor chip uses 0.4 μm emitter 25-GHz-f_T single-poly self-aligned Si bipolar technology and dissipates 4.6 W from a single -5 V supply

Keywords

binary sequences; bipolar integrated circuits; clocks; demultiplexing equipment; digital integrated circuits; error detection; integrated circuit testing; multiplexing equipment; optical communication equipment; 12.5 Gbit/s; 25 Gbit/s; 4.6 W; 5 V; DMUX; PRBS generation; PRBS testing; Si; Si bipolar IC; bit error detection; demultiplexing; descrambling; external MUX; input/output channels; multiplexing; pseudorandom binary sequences; scrambling; sequence length; single-poly self-aligned Si bipolar technology; switchable; transistor chip; trigger derivation; Bipolar integrated circuits; Circuit testing; Communication standards; Demultiplexing; Integrated circuit technology; Optical fiber communication; Optical fiber testing; Switches; System testing; Test equipment;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.262003

Filename

262003