DocumentCode :
1025650
Title :
Automated Testing of LSI
Author :
Rasmussen, R.A.
Author_Institution :
IBM General Technology Division
Volume :
15
Issue :
3
fYear :
1982
fDate :
3/1/1982 12:00:00 AM
Firstpage :
69
Lastpage :
78
Keywords :
Automatic testing; Circuit testing; Large scale integration; Logic circuits; Logic devices; Logic testing; Performance evaluation; Software testing; System testing; Test equipment;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.1982.1653974
Filename :
1653974
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1025650
