• DocumentCode
    1025684
  • Title

    dv/dt Dependence in metal oxide varistors

  • Author

    de Cogan, D. ; Leeson, Mark S

  • Author_Institution
    University of Nottingham, Department of Electrical & Electronic Engineering, Nottingham, UK
  • Volume
    22
  • Issue
    18
  • fYear
    1986
  • Firstpage
    950
  • Lastpage
    952
  • Abstract
    A dv/dt dependence has been observed in metal oxide varis-tors during impulse testing. A lossy dielectric model which provides a qualitative explanation of this behaviour can also be used to account for current overshoot.
  • Keywords
    impulse testing; semiconductor device testing; varistors; I-V characteristics; current overshoot; dv/dt dependence; impulse testing; lossy dielectric model; metal oxide varistors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19860648
  • Filename
    4256855
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1025684