DocumentCode
1025727
Title
Suitable polynomials for aliasing reduction by test vector reversal in signature analysers
Author
Raghemi-Azar, A. ; Maxwell, P.C.
Author_Institution
University of New South Wales, Joint Microelectronics Research Center, Kensington, Australia
Volume
22
Issue
18
fYear
1986
Firstpage
958
Lastpage
959
Abstract
Reversing test vector order has been recommended by some authors as a scheme to reduce aliasing in signature analysis of single-output logic circuits using linear feedback shift registers. The letter analyses the method from the approach of determining if it is valid for all characteristic polynomaials. It is concluded that there is a range of polynomials for which reversal of test vector order has no effect on aliasing reduction.
Keywords
logic testing; polynomials; aliasing reduction; linear feedback shift registers; polynomials; signature analysers; single-output logic circuits; test vector reversal;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19860653
Filename
4256860
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