• DocumentCode
    1025727
  • Title

    Suitable polynomials for aliasing reduction by test vector reversal in signature analysers

  • Author

    Raghemi-Azar, A. ; Maxwell, P.C.

  • Author_Institution
    University of New South Wales, Joint Microelectronics Research Center, Kensington, Australia
  • Volume
    22
  • Issue
    18
  • fYear
    1986
  • Firstpage
    958
  • Lastpage
    959
  • Abstract
    Reversing test vector order has been recommended by some authors as a scheme to reduce aliasing in signature analysis of single-output logic circuits using linear feedback shift registers. The letter analyses the method from the approach of determining if it is valid for all characteristic polynomaials. It is concluded that there is a range of polynomials for which reversal of test vector order has no effect on aliasing reduction.
  • Keywords
    logic testing; polynomials; aliasing reduction; linear feedback shift registers; polynomials; signature analysers; single-output logic circuits; test vector reversal;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19860653
  • Filename
    4256860