• DocumentCode
    1025775
  • Title

    Low-frequency noise measurements in silicon avalanche photodiodes

  • Author

    Baertsch, R.D.

  • Author_Institution
    G. E. Research and Dev. Center, Schenectady, N. Y.
  • Issue
    3
  • fYear
    1966
  • fDate
    3/1/1966 12:00:00 AM
  • Firstpage
    383
  • Lastpage
    385
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1966.15698
  • Filename
    1474288