DocumentCode :
1025775
Title :
Low-frequency noise measurements in silicon avalanche photodiodes
Author :
Baertsch, R.D.
Author_Institution :
G. E. Research and Dev. Center, Schenectady, N. Y.
Issue :
3
fYear :
1966
fDate :
3/1/1966 12:00:00 AM
Firstpage :
383
Lastpage :
385
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1966.15698
Filename :
1474288
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1025775
