DocumentCode :
1025790
Title :
Avalanche breakdown of diffused junctions in silicon epitaxial layers
Author :
Breitschwerdt, K.G.
Author_Institution :
Bell Telephone Labs., Inc., Laureldale, Penn.
Issue :
3
fYear :
1966
fDate :
3/1/1966 12:00:00 AM
Firstpage :
385
Lastpage :
387
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1966.15699
Filename :
1474289
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1025790
