DocumentCode :
1025868
Title :
Testing and Fault Tolerance of Multistage Interconnection Networks
Author :
Agrawal, Dharma P.
Author_Institution :
Wayne State University
Volume :
15
Issue :
4
fYear :
1982
fDate :
4/1/1982 12:00:00 AM
Firstpage :
41
Lastpage :
53
Keywords :
Circuit faults; Computer networks; Concurrent computing; Fault tolerance; Large scale integration; Multiprocessor interconnection networks; Parallel processing; Switches; Testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer
Publisher :
ieee
ISSN :
0018-9162
Type :
jour
DOI :
10.1109/MC.1982.1653997
Filename :
1653997
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1025868
