Title :
Measurement of the effective minority carrier lifetime in the floating region of a P-N-P-N device
Author :
Fournier, M. ; Lemyre, C.
Author_Institution :
Laval University, Quebec, Canada
fDate :
5/1/1966 12:00:00 AM
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1966.15720
