Measurement of the effective minority carrier lifetime in the floating region of a P-N-P-N device

Author

Fournier, M. ; Lemyre, C.

Author_Institution

Laval University, Quebec, Canada

Issue

fYear

1966

fDate

5/1/1966 12:00:00 AM

Firstpage

511

Lastpage

512

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

DOI

10.1109/T-ED.1966.15720

Filename

1474310

Link To Document