DocumentCode :
1026205
Title :
Transistor degradation following second breakdown
Author :
Huenemann, R.G.
Author_Institution :
IIT Research Institute, Chicago, Ill.
Issue :
7
fYear :
1966
fDate :
7/1/1966 12:00:00 AM
Firstpage :
605
Lastpage :
605
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1966.15741
Filename :
1474331
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1026205
