DocumentCode

1026205

Title

Transistor degradation following second breakdown

Author

Huenemann, R.G.

Author_Institution

IIT Research Institute, Chicago, Ill.

Issue

7

fYear

1966

fDate

7/1/1966 12:00:00 AM

Firstpage

605

Lastpage

605

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1966.15741

Filename

1474331