Title :
Moving grating during erasure in photorefractive Bi12SiO20 crystals
Author :
Hamel De Montchenault, G. ; Loiseaux, B. ; Huignard, J.P.
Author_Institution :
Thomson-CSF, Laboratoire Central de Recherches, Orsay, France
Abstract :
During the erasure of a photorefractive grating in Bi12SiO20, the space-charge field moves at a constant velocity and its amplitude exponentially decays. The experiment confirms that the diffracted beam is frequency-shifted and the amount of frequency shift is equal to that required for optimum beam coupling in nearly degenerate two-wave mixing.
Keywords :
bismuth compounds; diffraction gratings; optical frequency conversion; optical information processing; optical phase conjugation; optical storage; BSO photorefractive crystals; Bi12SiO20; constant velocity; degenerate two-wave mixing; diffracted beam; frequency shift; grating erasure; nonlinear optics; optimum beam coupling; space-charge field;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860704
