DocumentCode :
1026470
Title :
Charge instability in metal-silicon nitride-silicon structures
Author :
Szedon, J.R. ; Chu, T.L. ; Gruber, G.A.
Author_Institution :
Westinghouse R & D Center
Issue :
42591
fYear :
1966
Firstpage :
672
Lastpage :
672
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1966.15768
Filename :
1474358
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1026470
