• DocumentCode
    1026552
  • Title

    Progress in design for test: a personal view

  • Author

    Bennitts, R.G.

  • Author_Institution
    Synopsys Inc., Mountain Veiw, CA, USA
  • Volume
    11
  • Issue
    1
  • fYear
    1994
  • Firstpage
    53
  • Lastpage
    59
  • Abstract
    The author discusses the history and benefits of design for test. He describes common arguments against it and gives convincing rebuttals to each. In addition, he provides a glimpse into the future of DFT. The problem is that we do not have a measurable parameter that expresses the incremental gain in product quality arising from the addition of some specific DFT technique, compared to its cost of implementation. The author refers to this parameter as the quality improvement factor (Quif), and defines it as the benefit versus the cost of the DFT technique.<>
  • Keywords
    automatic test equipment; automatic testing; design for testability; Quif; design for test; future; history; incremental gain; measurable parameter; product quality; quality improvement factor; specific DFT technique; Application specific integrated circuits; Automatic test pattern generation; Automatic testing; Design for testability; History; Performance evaluation; Process design; Sequential analysis; Software tools; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.262322
  • Filename
    262322