• DocumentCode
    1026573
  • Title

    Random test length with and without replacement

  • Author

    Debany, W.H. ; Varshney, P.K. ; Hartmann, C.R.P.

  • Author_Institution
    US Air Force, Rome Air Development Center, RBRA, Reliability Assurance Section, Rome, USA
  • Volume
    22
  • Issue
    20
  • fYear
    1986
  • Firstpage
    1074
  • Lastpage
    1075
  • Abstract
    We compare the effectiveness of two methods of random test generation: with and without replacement of test patterns. Expressions for test length and test confidence for both methods are given. Determination of random test length is simpler when tests are generated with replacement, yet most practical random test methods produce tests without replacement. The conditions are obtained such that testing without replacement can be approximated using the simpler approach.
  • Keywords
    fault location; logic testing; detection probability; digital logic networks; fault detection; logic testing; random test generation; replacement; test confidence; test length;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19860736
  • Filename
    4256949
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1026573