Title :
Random test length with and without replacement
Author :
Debany, W.H. ; Varshney, P.K. ; Hartmann, C.R.P.
Author_Institution :
US Air Force, Rome Air Development Center, RBRA, Reliability Assurance Section, Rome, USA
Abstract :
We compare the effectiveness of two methods of random test generation: with and without replacement of test patterns. Expressions for test length and test confidence for both methods are given. Determination of random test length is simpler when tests are generated with replacement, yet most practical random test methods produce tests without replacement. The conditions are obtained such that testing without replacement can be approximated using the simpler approach.
Keywords :
fault location; logic testing; detection probability; digital logic networks; fault detection; logic testing; random test generation; replacement; test confidence; test length;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860736
