DocumentCode

1026587

Title

Relationships between low frequency gate noise and surface state conductance of the MOST

Author

Hielscher, F.H. ; Sah, C.T.

Author_Institution

University of Illinois

Issue

42591

fYear

1966

Firstpage

674

Lastpage

674

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1966.15781

Filename

1474371