DocumentCode :
1026587
Title :
Relationships between low frequency gate noise and surface state conductance of the MOST
Author :
Hielscher, F.H. ; Sah, C.T.
Author_Institution :
University of Illinois
Issue :
42591
fYear :
1966
Firstpage :
674
Lastpage :
674
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1966.15781
Filename :
1474371
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1026587
