DocumentCode :
1026669
Title :
Testing-Based Watermarking Techniques for Intellectual-Property Identification in SOC Design
Author :
Fan, Yu-Cheng
Author_Institution :
Nat. Taipei Univ. of Technol., Taipei
Volume :
57
Issue :
3
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Firstpage :
467
Lastpage :
479
Abstract :
The author proposes a novel testing-based watermarking scheme for intellectual-property (IP) identification in this paper. The principles are established for the development of new watermarking IP-identification procedures that depend on current IP-based design flow. The core concept is embedding a watermark-generating circuit (WGC) and a test circuit into the IP core at the behavior design level. Therefore, this scheme can also successfully survive synthesis, placement, and routing and can identify the IP core at various design levels. This method adopts current main system-on-a-chip (SOC) design-for-test (DFT) strategies. The identity of the IP is proven during the general test process without implementing any extra extraction flow. After the chip has been manufactured and packaged, it is still easy to detect the identification of the IP provider without the need to examine the microphotograph. On real designs, our approaches entail low hardware overhead, tracking costs, and processing-time costs. The proposed method solves the IP-identification problem.
Keywords :
design for testability; industrial property; system-on-chip; watermarking; SOC design; intellectual-property identification; system-on-a-chip design-for-test strategies; testing-based watermarking techniques; watermark-generating circuit; Design-for-test (DFT); intellectual-property (IP) identification; system-on-a-chip (SOC); very large scale integration (VLSI) design; watermarking;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.911623
Filename :
4419913
Link To Document :
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