Title :
New technique for analysing planar waveguides with finite metallisation thickness
Author :
Wu, K. ; Saguet, P.
Author_Institution :
Laboratoire d´´Electromagéntisme ENSERG, Grenoble, France
Abstract :
A new technique for analysing planar waveguides with finite metallisation thickness, based on the spectral-domain immitance approach, is presented. Fast formulation to the eigen-problem is proposed, and numerical results obtained in this way agree well with other methods.
Keywords :
eigenvalues and eigenfunctions; waveguide theory; finite metallisation thickness; planar waveguides; spectral-domain immitance approach;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860773
