DocumentCode :
1027151
Title :
Kernels for Generalized Multiple-Instance Learning
Author :
Tao, Qingping ; Scott, Stephen D. ; Vinodchandran, N.V. ; Osugi, Thomas Takeo ; Mueller, Brandon
Author_Institution :
GC Image, LLC, Lincoln, NE
Volume :
30
Issue :
12
fYear :
2008
Firstpage :
2084
Lastpage :
2098
Abstract :
The multiple-instance learning (MIL) model has been successful in numerous application areas. Recently, a generalization of this model and an algorithm for it were introduced, showing significant advantages over the conventional MIL model on certain application areas. Unfortunately, that algorithm is not scalable to high dimensions. We adapt that algorithm to one using a support vector machine with our new kernel kwedge. This reduces the time complexity from exponential in the dimension to polynomial. Computing our new kernel is equivalent to counting the number of boxes in a discrete, bounded space that contain at least one point from each of two multisets. We show that this problem is #P-complete, but then give a fully polynomial randomized approximation scheme (FPRAS) for it. We then extend k by enriching its representation into a new kernel kmin, and also consider a normalized version of kwedge that we call k (which may or may not not be a kernel, but whose approximation yielded positive semidefinite Gram matrices in practice). We then empirically evaluate all three measures on data from content-based image retrieval, biological sequence analysis, and the musk data sets. We found that our kernels performed well on all data sets relative to algorithms in the conventional MIL model.
Keywords :
approximation theory; computational complexity; learning (artificial intelligence); support vector machines; #P-complete; FPRAS; MIL; biological sequence analysis; content-based image retrieval; fully polynomial randomized approximation scheme; generalized multiple-instance learning; musk data sets; support vector machine; time complexity; Machine learning; generalized multiple-instance learning; kernels; support vector machines; Algorithms; Artificial Intelligence; Computer Simulation; Models, Theoretical; Pattern Recognition, Automated;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2007.70846
Filename :
4420086
Link To Document :
بازگشت