Title :
Magnetooptical disk with alumina based oxide layer
Author :
Watanabe, Y. ; Tsuchiya, J. ; Kobayashi, Y. ; Yoshitomi, T.
Author_Institution :
Mitsubishi Chemical Industries, Yokohama, Japan
fDate :
9/1/1987 12:00:00 AM
Abstract :
Several kinds of oxides were examined as a material for protection layer of magneto-optical disk. Aging characteristics such as transparency and crystal structure of Tb thin film sandwiched by the oxide layers were examined in order to estimate the validity of oxides. Well-known oxides such as SiO2and Al2O3, were found to be inadequate as a protection layer for the RETM film. Mixed oxids based on Al2O3were found to be one of the most suitable protection layer.
Keywords :
Aluminum materials/devices; Magnetooptic memories; Aging; Degradation; Diffraction; Hysteresis; Optical films; Oxidation; Plastics; Protection; Temperature; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1065304
