DocumentCode :
1027347
Title :
Comparative Study on Drive Current of III–V Semiconductor, Ge and Si Channel n- mosfets based on Quantum-Corrected Monte Carlo Simulation
Author :
Mori, Takashi ; Azuma, Yüsuke ; Tsuchiya, Hideaki ; Miyoshi, Tanroku
Author_Institution :
Kobe Univ., Kobe
Volume :
7
Issue :
2
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Firstpage :
237
Lastpage :
241
Abstract :
Recently, a variety of new channel materials have been intensively studied to achieve a continuous enhancement in drive current of n-channel MOSFETs. In this paper, we performed a quantum-corrected Monte Carlo device simulation to examine advantages of new channel materials such as III-V compound semiconductors and Ge, by considering scattering effects, quantum mechanical effects, and new device structure. Then, we found that all materials converge to the similar current level as the channel length decreases, but Ge-MOSFET with (111) surface orientation and InP-MOSFET provide higher drive current than the other materials under the quasi-ballistic transport. Furthermore, we demonstrated that the reduction of parasitic resistance in source and drain regions will be indispensable to maintain a definite advantage of III-V materials.
Keywords :
III-V semiconductors; MOSFET; Monte Carlo methods; ballistic transport; elemental semiconductors; germanium; indium compounds; semiconductor device models; silicon; Ge; III-V semiconductor; InP; Si; channel length; drive current; parasitic resistance; quantum mechanical effects; quantum-corrected Monte Carlo simulation; quasiballistic transport; scattering effects; semiconductor channel n-MOSFET; surface orientation; Ballistic transport; ballistic transpot; drive current; high mobility channel materials; nanoscale mosfets; nanoscale MOSFETs; quantum-corrected Monte Carlo (MC) simulation; quantum-corrected Monte Carlo simulation;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2007.915002
Filename :
4420102
Link To Document :
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