DocumentCode :
1027469
Title :
High-speed current limiters
Author :
Boll, H.J. ; Iwersen, J.E. ; Perry, E.W.
Author_Institution :
Bell Telephone Labs., Inc., Murray Hill, N. J.
Issue :
12
fYear :
1966
Firstpage :
904
Lastpage :
907
Abstract :
Current limiters based on the high-field saturation of electron-drift velocity in germanium have been fabricated by making two closely spaced ohmic contacts to a surface n-layer diffused into Ge. In operation, current flows from contact to contact through the n-layer. Current saturation begins at a voltage V_{s} = E_{s} d , where d is the contact spacing and Esis the field for saturation of electron drift velocity. Generally, in order to work at reasonable signal levels (volts and milliamperes) a structure small in all dimensions is required. A diffused-layer structure provides a convenient way of meeting this requirement and, at the same time, has, first, a high surface-to-volume ratio which facilitates heat removal and, second, a p-n junction which minimizes conductivity modulation by removing avalanche-generated holes. Limiters with d \\cong 2 µ, and 10 µ × 10 µ contacts, were fabricated on Sb-diffused layers of 103-Ω sheet resistance and ∼1017cm-3surface concentration. Limiting current was ∼2.5 mA and limiting extended from ∼2 to 16 V. The conductance in the limiting range was ∼40 µmho and a contact-to-contact capacitance was ∼0.1 pF.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1966.15866
Filename :
1474456
Link To Document :
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