DocumentCode :
1027738
Title :
Papers on carrier drift velocities in silicon at high electric field strengths
Author :
Gibbons, J.F.
Volume :
14
Issue :
1
fYear :
1967
fDate :
1/1/1967 12:00:00 AM
Firstpage :
37
Lastpage :
37
Keywords :
Charge carrier processes; Charge carriers; Charge measurement; Current measurement; Electric variables measurement; Electrical resistance measurement; Electron mobility; Mathematical analysis; Silicon; Velocity measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1967.15892
Filename :
1474615
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1027738
