• DocumentCode
    1027856
  • Title

    Influence of mobility and lifetime variations on drift-field effects in silicon-junction devices

  • Author

    Bullis, W.Murray ; Runyan, W.R.

  • Author_Institution
    National Bureau of Standards, Washington, D. C.
  • Volume
    14
  • Issue
    2
  • fYear
    1967
  • fDate
    2/1/1967 12:00:00 AM
  • Firstpage
    75
  • Lastpage
    81
  • Abstract
    An analysis of devices with drift fields formed by an impurity gradient is carried out allowing for lifetime and mobility variations with impurity concentration. In the case of silicon n-on-p photovoltaic solar cells, a field width of about twice the diffusion length of the minority carriers maximizes the collection efficiency. For lifetimes longer than one microsecond the optimum field width is about 25 µm, a value governed by the absorption characteristics rather than the diffusion length. In most cases, increasing the concentration ratio above 3 orders of magnitude is of little or no assistance in improving the collection efficiency. It is also shown that if the constant relating lifetime to high energy-particle flux is a strong function of impurity concentration, there is little advantage in using drift-field solar cell structures to enhance radiation resistance.
  • Keywords
    Absorption; Electric resistance; Electron mobility; Germanium; Impurities; Instruments; Photovoltaic cells; Photovoltaic systems; Silicon; Solar power generation;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1967.15902
  • Filename
    1474625