DocumentCode :
1028218
Title :
A model of the avalanche photodiode
Author :
Biard, James R. ; Shaunfield, W.N., Jr.
Author_Institution :
Texas Instruments Incorporated, Dallas, Tex.
Volume :
14
Issue :
5
fYear :
1967
fDate :
5/1/1967 12:00:00 AM
Firstpage :
233
Lastpage :
238
Abstract :
A general model for the avalanche photodiode is presented. It is shown that the diode consists of four regions: 1) guard ring, 2) uniform avalanche region, 3) high-field absorption region and 4) zero-field absorption region. Expressions are given for the ac quantum efficiency, the dc quantum efficiency, and the transit time cutoff frequency. Material requirements are discussed. Based on an entire detector system, an expression is derived for the signal-to-noise ratio. An example is given with the result that a noise-equivalent power (NEP) of 10-12W/Hz1/2is obtained with an optimum avalanche gain of approximately 23.
Keywords :
Absorption; Avalanche photodiodes; Cutoff frequency; Detectors; Electric breakdown; Optical modulation; P-i-n diodes; Semiconductor device noise; Semiconductor diodes; Solid state circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1967.15936
Filename :
1474659
Link To Document :
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