• DocumentCode
    1028246
  • Title

    Thermal properties of high-power transistors

  • Author

    Winkler, Richard H.

  • Author_Institution
    Teledyne, Inc., Mountain View, Calif.
  • Volume
    14
  • Issue
    5
  • fYear
    1967
  • fDate
    5/1/1967 12:00:00 AM
  • Firstpage
    260
  • Lastpage
    263
  • Abstract
    The temperature of a transistor can be determined from the emitter-base voltage versus collector-current characteristic. This characteristic was used for studying the stability of parallel pairs of high-frequency high-power transistors. The thermal effect may cause the incremental emitter-base resistance to assume a negative value. This, in turn, will cause the current flow in a pair of transistors to be asymmetrical. The transition from symmetrical to asymmetrical current flow occurs at a power level which is determined by the nonshared thermal and electrical resistances. Stability to a higher current level can be obtained by increasing the nonshared emitter or base resistances or reducing the collector voltage. Higher currents can also be obtained by reducing the nonshared thermal resistances which indicates close thermal coupling between the two units is desirable.
  • Keywords
    Charge carrier processes; Current measurement; Electric resistance; Electron emission; Power dissipation; Resistance heating; Stability; Temperature; Thermal resistance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1967.15939
  • Filename
    1474662