DocumentCode :
1028297
Title :
Permeability dependence of thin film head reproducing performance
Author :
Tanabe, M. ; Kawakami, K. ; Saitoh, M. ; Takagi, M.
Author_Institution :
Hitachi Research Laboratory of Hitachi Ltd., Ibaraki, Japan
Volume :
23
Issue :
5
fYear :
1987
fDate :
9/1/1987 12:00:00 AM
Firstpage :
3158
Lastpage :
3160
Abstract :
Permeability of Ni-Fe thin film head yokes and its effect on the head sensitivity were studied by simulations and experiments. Examinations focused on head inductance with closed magnetic paths and reproducing performance. The reproduced output signal amplitude resulted from simulations had a larger permeability dependence around the pole tip than any other areas. The output was reduced approximately 2 % when the permeability around the tip was lowered from 3000 to 300. This permeability was estimated at between 50 and 300 in fabricated heads, while it was approximately 1000 elsewhere.
Keywords :
Magnetic recording/reading heads; Equations; Finite element methods; Inductance measurement; Magnetic flux; Magnetic heads; Magnetic recording; Permeability measurement; Predictive models; Saturation magnetization; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1987.1065389
Filename :
1065389
Link To Document :
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