Title :
Minimum yield for economical probing of semiconductor devices
fDate :
6/1/1967 12:00:00 AM
Keywords :
Computed tomography; Cost function; Feedback; Noise level; Probes; Radiative recombination; Semiconductor device noise; Semiconductor devices; Semiconductor diodes; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1967.15957
