• DocumentCode
    1028555
  • Title

    Masterimage approach to VLSI design

  • Author

    Donze, Richard L. ; Sporzynski, George

  • Author_Institution
    IBM Corporation
  • Volume
    16
  • Issue
    12
  • fYear
    1983
  • Firstpage
    18
  • Lastpage
    25
  • Abstract
    The rapid development of semiconductor technology and the increasing complexity of VLSI chips have prompted a wide range of design approaches. Among them is one called the masterimage method, which is somewhere between the unconstrained approach, in which the designer has essentially total freedom, and the constrained approach, typified by the gate array. The masterimage design methodology, which has been implemented on an extension of IBM´s engineering design system, can design chips with up to ten thousand equivalent two-way NOR gates. A key feature of the EDS extension is its ability to design chips with macros, or blocks of circuitry such as RAMs and PLAs. The EDS provides for logic simulation, test-pattern generation, description of the chip image (layout) and circuits, and automated placement and interconnection of circuits and macros. A delay calculator/optimizer insulates logic design from performance considerations. The emphasis in this article is on the overall solution to the problem of designing complex VLSI chips. Details of the technology or algorithms are discussed only when needed to illustrate the system´s capabilities.
  • Keywords
    Circuit testing; Design engineering; Design methodology; Logic testing; Manufacturing processes; Programmable logic arrays; Semiconductor device measurement; Shape measurement; Systems engineering and theory; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1983.1654265
  • Filename
    1654265