Title :
Direct measurement of side fringe field and two-dimensional head field using high-resolution inductive loop
Author :
Watanuki, O. ; Sueoka, K. ; Ashar, K.G.
Author_Institution :
Tokyo Research Laboratory, IBM Japan. Ltd., Tokyo, Japan
fDate :
9/1/1987 12:00:00 AM
Abstract :
A method is described to measure side fringing fields and two-dimensional head field distribution using a high-resolution inductive loop. To study the side fringing effects, measurements are performed with thin film heads.
Keywords :
Magnetic measurements; Magnetic recording/reading heads; Density measurement; Difference equations; Ferrites; Frequency measurement; Laboratories; Length measurement; Magnetic heads; Size measurement; Transistors; Voltage measurement;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1065413
