DocumentCode
1028562
Title
Direct measurement of side fringe field and two-dimensional head field using high-resolution inductive loop
Author
Watanuki, O. ; Sueoka, K. ; Ashar, K.G.
Author_Institution
Tokyo Research Laboratory, IBM Japan. Ltd., Tokyo, Japan
Volume
23
Issue
5
fYear
1987
fDate
9/1/1987 12:00:00 AM
Firstpage
3164
Lastpage
3166
Abstract
A method is described to measure side fringing fields and two-dimensional head field distribution using a high-resolution inductive loop. To study the side fringing effects, measurements are performed with thin film heads.
Keywords
Magnetic measurements; Magnetic recording/reading heads; Density measurement; Difference equations; Ferrites; Frequency measurement; Laboratories; Length measurement; Magnetic heads; Size measurement; Transistors; Voltage measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1987.1065413
Filename
1065413
Link To Document