• DocumentCode
    1028573
  • Title

    The fields due to a small loaded loop in free space

  • Author

    Upton, Miles E G ; Marvin, Andrew C.

  • Author_Institution
    Dept. of Electron., York Univ., UK
  • Volume
    36
  • Issue
    1
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    7
  • Lastpage
    13
  • Abstract
    A theoretical analysis of a resistively loaded, electrically small loop is presented which shows the variations of the transverse-wave impedance close to the loop as the resistive loading is altered. The theoretical results are compared with those obtained from a numerical simulation using Numerical Electromagnetics Code (NEC). Depending upon the loading, the loop exhibits electric (high wave impedance) or magnetic (low wave impedance) dipole properties, or intermediate wave impedances. These changes in wave impedance are closely related to variations in the far-field radiation pattern, and simulations are used to demonstrate this. Measured results are used to demonstrate that the variations predicted in wave impedance actually occur in practice. These results have bearing on the interpretation of emission measurements and on the design of circuits to minimize interference to other neighboring circuits
  • Keywords
    antenna radiation patterns; electric impedance; electric impedance measurement; interference suppression; loop antennas; NEC; Numerical Electromagnetics Code; circuit design; electric dipole; electrically small loop; electromagnetic radiation; emission measurements; far-field radiation pattern; high wave impedance; interference reduction; intermediate wave impedance; low wave impedance; magnetic dipole; numerical simulation; resistively loaded loop; transverse wave impedance; Antenna measurements; Antenna radiation patterns; Circuits; Electromagnetic measurements; Electromagnetic radiation; Geometry; Impedance measurement; Magnetic analysis; Magnetic field measurement; National electric code;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.265474
  • Filename
    265474