• DocumentCode
    1028605
  • Title

    Near-zero magnetostriction NiFe films deposited by ion beam sputtering

  • Author

    Lo, Jerry ; Hwang, C. ; Huang, T.C. ; Campbell, R.

  • Author_Institution
    IBM Magnetic Recording Institute
  • Volume
    23
  • Issue
    5
  • fYear
    1987
  • fDate
    9/1/1987 12:00:00 AM
  • Firstpage
    3065
  • Lastpage
    3067
  • Abstract
    Near-zero magnetostriction permalloy films, 3000Å thick, were made by ion beam sputtering with a Ni80Fe20target. The placing of a Ni strip onto the target and N2addition were used to independently adjust the film composition and crystalline texture respectively. Film composition and crystalline texture were investigated using X-ray fluorescence and diffraction. A change of the magnetostriction constant λ expressed in terms of ΔHk, obtained by straining the film, was also observed after a 250°C easy axis annealing in a vacuum oven. We suggest that this change may be related to an observed change in microstructure of the NiFe for low and a reduction of the I200/I111X-ray peak intensity ratio for high N2partial pressures.
  • Keywords
    Ion radiation effects; Magnetostriction; Permalloy films/devices; Annealing; Crystallization; Fluorescence; Ion beams; Iron; Magnetostriction; Ovens; Sputtering; Strips; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1987.1065417
  • Filename
    1065417