Title :
Detailed theory of the negative conductance of bulk negative mobility amplifiers, in the limit of zero ion density
Author :
Kroemer, Herbert
Author_Institution :
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, Calif.
fDate :
9/1/1967 12:00:00 AM
Abstract :
The complex admittance behavior is calculated for a bulk negative conductivity semiconductor, such as n-type GaAs, in the limit of zero doping and zero trapping, when all electrons are due to space-charge limited emissions from the cathode. Two different approximations are used: in the first, in closed analytical form, electron diffusion is neglected; in the second, by computer simulation of the internal space-charge dynamics, it is included. Both approximations agree at low frequencies where they predict a positive device conductance. Both predict a negative conductance, of slightly different magnitude, at frequencies around the reciprocal electron transit time. At higher frequencies the diffusionless theory predicts slowly damped conductance oscillations; diffusion effects strongly increase the damping.
Keywords :
Admittance; Cathodes; Computer simulation; Conductivity; Damping; Electron emission; Electron traps; Frequency; Gallium arsenide; Semiconductor device doping;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1967.15991