Behavioral Models of IC Output Buffers From on-the-Fly Measurements

This paper addresses the development of accurate and efficient models of the output ports of digital integrated circuits (ICs). The proposed approach is based on the estimation of suitable mathematical relations reproducing the external behavior of devices. Device models are obtained through a well-established procedure from port transient voltage and current responses recorded during the normal activity of the IC mounted on a real board, thus avoiding specific modeling setup and test fixtures. The efficiency of the approach is demonstrated on real devices from both numerical simulations and actual measurements.